UNIVERSITY OF BUCHAREST
FACULTY OF PHYSICS

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2024-11-23 18:21

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Conference: Bucharest University Faculty of Physics 2014 Meeting


Section: Solid State Physics and Materials Science


Title:
(Ba1−xCax)(ZryTi1−y)O3 lead-free ferroelectric thin films by PLD


Authors:
A.I. BERCEA (1), N.D. SCARISONEANU (2), F. CRACIUN (3), A. ANDREI (2), V. ION (1,2), R. BIRJEGA (2) and M. DINESCU (2)


Affiliation:
1)University of Bucharest, Faculty of Physics, 405 Atomistilor St, RO-077125, Magurele, Romania

2)National Institute for Laser, Plasma and Radiation Physics, 409 Atomistilor St, RO-077125, Magurele, Romania

3)CNR-ISC, Istituto Dei Sistemi Complessi, Via del Fosso del Cavaliere 100, I-00133 Rome, Italy



E-mail
bercea_adrian.ionut@yahoo.com


Keywords:
PLD, BCTZ thin films, X-ray, AFM, SEM, SE


Abstract:
Piezoelectric and ferroelectric materials such as lead zirconium titanate (PZT) are keys to modern technologies due to his high dielectric constant and strong piezoelectric response. The main drawback of PZT is the high toxicity of lead and for that reason new materials are being developed. Recently, studies on a new lead-free piezoelectric material namely BZT-BCT or BCTZ, have shown impressive piezoelectric an ferroelectric properties exhibited for specific BCTZ bulk compositions. In this work, BCTZ thin films were deposited using pulsed laser deposition method (PLD) with a ArF excimer laser, on platinum coated silicon substrate in a reactive environment (oxygen). The properties of the BCTZ thin films such as optical and electrical properties, thickness, roughness and dielectric constant were investigated by X -ray diffraction, Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Spectroscopic Ellipsometry (SE) techniques.